Atomic force microscope imaging contrast based on molecular recognition

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Atomic force microscope imaging contrast based on molecular recognition.

The contrast in atomic force microscope images arises from forces between the tip and the sample. It was shown recently that specific molecular interaction forces may be measured with the atomic force microscope; consequently, we use such forces to map the distribution of binding partners on samples. Here we demonstrate this concept by imaging a streptavidin pattern with a biotinylated tip in a...

متن کامل

Size-dependent on vibration and flexural sensitivity of atomic force microscope

In this paper, the free vibration behaviors and flexural sensitivity of atomic force microscope cantilevers with small-scale effects are investigated. To study the small-scale effects on natural frequencies and flexural sensitivity, the consistent couple stress theory is applied. In this theory, the couple stress is assumed skew-symmetric. Unlike the classical beam theory, the new model contain...

متن کامل

Imaging bandwidth of the tapping mode atomic force microscope probe

János Kokavecz,1,* Othmar Marti,2 Péter Heszler,3,4 and Ádám Mechler5,† 1Department of Optics and Quantum Electronics, University of Szeged, P.O. Box 406, H-6701 Szeged, Hungary 2Department of Experimental Physics, University of Ulm, Albert-Einstein-Allee 11 D-89069 Ulm, Germany 3Research Group on Laser Physics of the Hungarian Academy of Sciences, P.O. Box 406, H-6701 Szeged, Hungary 4The Ångs...

متن کامل

High-speed atomic force microscope imaging: adaptive multiloop mode.

In this paper, an imaging mode (called the adaptive multiloop mode) of atomic force microscope (AFM) is proposed to substantially increase the speed of tapping mode (TM) imaging while preserving the advantages of TM imaging over contact mode (CM) imaging. Due to its superior image quality and less sample disturbances over CM imaging, particularly for soft materials such as polymers, TM imaging ...

متن کامل

Nanotopographical imaging using a heated atomic force microscope cantilever probe

This paper reports quantitative topographical measurements using a heated atomic force microscope (AFM) cantilever probe. The study compares opographies measured by the cantilever thermal signal to topographies measured by the laser-deflection signal of an AFM system. The experiment sed 20 and 100 nm tall Si gratings as topographical test samples. The cantilever heater temperature ranged from 1...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Biophysical Journal

سال: 1997

ISSN: 0006-3495

DOI: 10.1016/s0006-3495(97)78685-5